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机译:
机译:Photoluminescence topography of shallow impurities in GaAs epilayers grown by metalorganic vapor phase epitaxy
机译:A quantitative model for an interaction between extended dislocation loops and impurities in Czochralski silicon based upon the photoluminescence analysis
机译:Photoluminescence characterization of silicon nanostructures embedded in silicon oxide
机译:Enhanced photoluminescence and characterization of multicolor carbon dots using plant soot as a carbon source
机译:Usa / FBR program Fast Flux Test Facility startup physics and Reactor Characterization methods and Results。