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Study of A-site and B-site Doping on Multiferroic Properties of BFO Thin Films

机译:A位和B位掺杂对BFO薄膜多铁性的研究

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摘要

The 12% Cerium (Ce) and 10% Manganese (Mn) were doped at A and B sites respectively in BiFeO_3 (BFO) thin films along with incorporation of 5% excess Bi. Pure and undoped BFO thin film capacitors are fabricated on indium tin oxide (ITO) coated corning glass and silicon substrate by chemical solution deposition (CSD) method. Film becomes preferred oriented along (110) directions with introduction of Mn and Ce in the host BFO lattice. Leakage current density is reduced by about 4 orders from (4.59 × 10~(-3) A/cm~2) to about 2.91 × 10~(-7)A/cm~2 at 100 KV/cm field after 12% Ce doping in BFO (BCFO) thin film. Enhanced ferroelectric response with saturated P-E loop is observed for BCFO thin film in compare to that obtained for 10% Mn doped BFO (BFMO) thin film. Improved capacitance-voltage characteristics with good butterfly loop is obtained for Bi_(0.88)Ce_(0.12)FeO_3 thin film, indicating an increased degree of ferroelectricity. However, enhanced M-H loop with well saturation magnetization (Ms ~ 19.65 emu/g) is observed for BFMO thin films while wasp waist loops (pinched) are observed for BCFO thin films with slightly degraded ferromagnetic properties.
机译:在BiFeO_3(BFO)薄膜的A和B位置分别掺杂了12%的铈(Ce)和10%的锰(Mn),并掺入了5%的过量Bi。通过化学溶液沉积(CSD)方法,在涂有铟锡氧化物(ITO)的康宁玻璃和硅基板上制造纯净和未掺杂的BFO薄膜电容器。通过在主体BFO晶格中引入Mn和Ce,薄膜优选沿(110)方向取向。在12%Ce的情况下,在100 KV / cm电场下,泄漏电流密度从(4.59×10〜(-3)A / cm〜2)降低到约2.91×10〜(-7)A / cm〜2 4个数量级在BFO(BCFO)薄膜中掺杂。与10%Mn掺杂的BFO(BFMO)薄膜相比,BCFO薄膜具有饱和P-E回路增强的铁电响应。对于Bi_(0.88)Ce_(0.12)FeO_3薄膜,具有良好的蝶形环路,从而改善了电容-电压特性,表明铁电程度增加。但是,对于BFMO薄膜,观察到增强的M-H环,具有良好的饱和磁化强度(Ms〜19.65 emu / g),而对于铁磁性能稍有下降的BCFO薄膜,则观察到了黄蜂腰环(收缩)。

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