Influence of B_2O_3 on Microstructure and Microwave Dielectric Properties of 0.45La_(0.97)Sm_(0.03)(Mg_(0.5)Sn_(0.5)) O_3-0.55Ca_(0.8)Sm_(0.4)/3TiO_3 Ceramic System

摘要

The influence of B_2O_3 on the microstructure and microwave dielectric properties of the 0.45La_(0.97)Sm_(0.03)(Mg_(0.5)Sn_(0.5)) O_3-0.55Ca_(0.8)Sm_(0.4)/3TiO_3 ceramic system were investigated with a view to their application in microwave devices. A B_2O_3-doped 0.45La_(0.97)Sm_(0.03)(Mg_(0.5)Sn_(0.5)) O_3-0.55Ca_(0.8)Sm_(0.4)/3TiO_3 ceramic system was prepared using the conventional solid-state method. The X-ray diffraction patterns of the B_2O_3-doped 0.45La_(0.97)Sm_(0.03)(Mg_(0.5)Sn_(0.5)) O_3-0.55Ca_(0.8)Sm_(0.4)/3TiO_3 ceramic system did not significantly vary with sintering temperature. A dielectric constant of 35.5, a quality factor (Q×f) of 5,500 GHz, and a temperature coefficient of resonant frequency of -1 ppmPC were obtained when the 2 wt% B_2O_3-doped 0.45La_(0.97)Sm_(0.03)(Mg_(0.5)Sn_(0.5)) O_3-0.55Ca_(0.8)Sm_(0.4)/3TiO_3 ceramic system was sintered at 1450° C for 4 h.