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首页> 外文期刊>Geostandards and geoanalytical research >Analysis of sediments and soils by X-ray fluorescence spectrometry using matrix corrections based on fundamental parameters
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Analysis of sediments and soils by X-ray fluorescence spectrometry using matrix corrections based on fundamental parameters

机译:基于基本参数的矩阵校正通过X射线荧光光谱法分析沉积物和土壤

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摘要

Wavelength dispersive X-ray fluorescence spectrometry (WD-XRF) is widely used for the analysis of soils and sediments using well characterised procedures. However, difficulties can occur with samples such as unknowns containing small amounts of ore materials and samples collected from contaminated sites where trace elemental concentrations can exceed the concentration range for routine analysis. We studied the performance of a commercially available method, based on fundamental parameters (FP) to correct matrix effects. The spectrometer was originally calibrated with elemental or simple compound calibrants. Samples were analysed as pressed powder pellets. Eighteen sediment and soil reference materials, three of them with certified values for some of their constituents, were used to evaluate accuracy, by comparing results with recommended values and their standard deviations (RV +/- 2s) or certified values and their confidence intervals (CV +/- Cl). When results fell systematically outside these intervals, calibrations were refined with wgeochemical reference materials. The best agreement of results with recommended and certified values was obtained when the contents of H2O and C in each sample were included as matrix constituents during calculations. The detection limits of trace elements tended to be relatively high, because the measuring conditions employed were not maximised for sensitivity. The main advantage of the method tested was that it enabled the analysis of samples with high concentrations of trace elements and the determination of elements such as F, Bi, Sb and W, which are not commonly included in quantitative XRF analysis of geological samples.
机译:波长色散X射线荧光光谱法(WD-XRF)被广泛地用于使用特征明确的程序分析土壤和沉积物。但是,样品(例如含有少量矿物质的未知物)和从受污染场所收集的样品可能会出现困难,在这些场所,微量元素的浓度可能超过常规分析的浓度范围。我们基于基本参数(FP)研究了市售方法的性能,以校正基质效应。光谱仪最初是用元素或简单的化合物校准剂校准的。将样品分析为压制粉末颗粒。通过将结果与推荐值及其标准偏差(RV +/- 2s)或认证值及其置信区间(RV)进行比较,使用了18种沉积物和土壤参考材料(其中3种具有某些成分的认证值)来评估准确性。 CV +/- Cl)。当结果系统地落在这些时间间隔之外时,可以使用地球化学参考材料完善校准。在计算过程中,将每个样品中的H2O和C的含量作为基质成分包括在内时,可以得到与推荐值和认证值的最佳结果。痕量元素的检出限往往较高,因为所采用的测量条件并未使灵敏度最大化。所测试方法的主要优点在于,它能够分析高浓度痕量元素的样品,并能测定F,Bi,Sb和W等元素,而这些元素通常不包括在地质样品的定量XRF分析中。

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