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Crystal growth and structural analysis of zirconium sulphoselenide single crystals

机译:磺化硒化锆单晶的晶体生长和结构分析

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A series of zirconium sulphoselenide (ZrS_xSe_(3-x), where x = 0, 0.5,1,1.5, 2, 2.5, 3) single crystals have been grown by chemical vapour transport technique using iodine as a transporting agent. The optimum condition for the growth of these crystals is given. The stoichiometry of the grown crystals were confirmed on the basis of energy dispersive analysis by X-ray (EDAX) and the structural characterization was accomplished by X-ray diffraction (XRD) studies. The crystals are found to possess monoclinic structure. The lattice parameters, volume, particle size and X-ray density have been carried out for these crystals. The effect of sulphur proportion on the lattice parameter, unit cell volume and X-ray density in the series of ZrS_xSe_(3-x) single crystals have been studied and found to decrease in all these parameters with rise in sulphur proportion. The grown crystals were examined under optical zoom microscope for their surface topography study. Hall effect measurements were carried out on grown crystals at room temperature. The negative value of Hall coefficient implies that these crystals are n-type in nature. The conductivity is found to decrease with increase of sulphur content in the ZrS_xSe_(3-x) series. The electrical resistivity parallel to c-axis as well as perpendicular to c-axis have been carried out in the temperature range 303-423 K. The results obtained are discussed in detail.
机译:一系列的硫代硒化锆(ZrS_xSe_(3-x),其中x = 0、0.5、1、1.5、2、2.5、3)单晶已通过化学气相传输技术使用碘作为传输剂进行了生长。给出了这些晶体生长的最佳条件。在X射线(EDAX)能量色散分析的基础上,确定了生长晶体的化学计量,并通过X射线衍射(XRD)研究完成了结构表征。发现该晶体具有单斜晶结构。对这些晶体进行了晶格参数,体积,粒度和X射线密度的测定。研究了ZrS_xSe_(3-x)单晶系列中硫比例对晶格参数,晶胞体积和X射线密度的影响,发现这些参数随硫比例的增加而降低。在光学变焦显微镜下检查生长的晶体的表面形貌。在室温下对生长的晶体进行霍尔效应测量。霍尔系数的负值意味着这些晶体本质上是n型的。发现电导率随着ZrS_xSe_(3-x)系列中硫含量的增加而降低。平行于c轴以及垂直于c轴的电阻率已在303-423 K的温度范围内进行。详细讨论了获得的结果。

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