...
首页> 外文期刊>Bulletin of Materials Science >Ground state structures and properties of small hydrogenated silicon clusters
【24h】

Ground state structures and properties of small hydrogenated silicon clusters

机译:小型氢化硅团簇的基态结构和性质

获取原文
获取原文并翻译 | 示例
           

摘要

We present results for ground state structures and properties of small hydrogenated silicon clusters using the Car-Parrinello molecular dynamics with simulated annealing. We discuss the nature of bonding of hydrogen in these clusters. We find that hydrogen can form a bridge like Si-H-Si bond connecting two silicon atoms. We find that in the case of a compact and closed silicon cluster hydrogen bonds to the silicon cluster from outside. To understand the structural evolutions and properties of silicon cluster due to hydrogenation, we have studied the cohesive energy and first excited electronic level gap of clusters as a function of hydrogenation. We find that first excited electronic level gap of Si_n and Si_nH fluctuates as function of size and this may provide a first principle basis for the short-range potential fluctuations in hydrogenated amorphous silicon. The stability of hydrogenated silicon clusters is also discussed.
机译:我们使用模拟退火的Car-Parrinello分子动力学,给出了小氢化硅簇的基态结构和性质的结果。我们讨论了这些簇中氢键的本质。我们发现氢可以形成连接两个硅原子的类似Si-H-Si键的桥。我们发现,在紧密密闭的硅团簇中,氢从外部与硅团簇键合。为了了解氢化引起的硅团簇的结构演变和性质,我们研究了团簇的内聚能和第一激发电子能级间隙随氢化作用的变化。我们发现Si_n和Si_nH的第一激发电子能级间隙随尺寸而波动,这可能为氢化非晶硅中短程电势波动提供第一个原理基础。还讨论了氢化硅团簇的稳定性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号