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机译:
Infineon Technol Austria AG, Siemensstr 2, A-9500 Villach, Austria;
TU Wien, Inst Solid State Elect, Floragasse 4, A-1040 Vienna, Austria;
机译:Hot-Carrier Degradation and Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: Similarities and Differences
机译:The role of the conduction electrons in the formation of a thermal boundary resistance of the metal-dielectric interface and resistivity of the metal films at low temperatures (Review Article)
机译:Density of Traps at the Insulator/III-N Interface of GaN Heterostructure Field-Effect Transistors Obtained by Gated Hall Measurements
机译:3 days Summer School on Dielectric Interfaces参加报告
机译:NJL和PNJL模型中的Spinodal Instability
机译:集成氧化物限制孔径的电泵III-N型微腔光发射器
机译:介质阻挡放电等离子体技术的研究进展Review on Dielectric Barrier Discharge Plasma Technology
机译:先进的飞机接口:人机界面的机器侧(Les Interfaces sur les avions de pointe:L'aspect machine de l'Interface Homme-machine)。