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Surface Adsorption of PEG and Cl~- Additives for Copper Damascene Electrodeposition

机译:PEG和Cl〜-添加剂在铜镶嵌电沉积中的表面吸附

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摘要

Copper plate was observed by atomic force microscopy (AFM) after it was immersed in acid electrolyte with polyethylene glycol (PEG) and chloride ions (Cl~-). The AFM image confirmed the existence of adsorbed particles, which are in a flat-cone shape with a bottom radius of 15-25 nm and a height of 2-4 nm. The intermediate complex of copper dissolution/deposition was investigated by means of an electrochemical quartz crystal microbalance through detecting the simultaneous mass change of the electrode during cyclic voltammetric (CV) measurement. The two current peaks in the CV curves illustrate the generation and consumption of intermediate complex Cu~+ centre dot Cl~- centre dot PEG on the copper electrode.
机译:将铜板浸入具有聚乙二醇(PEG)和氯离子(Cl〜-)的酸性电解质中后,用原子力显微镜(AFM)观察。原子力显微镜图像证实存在吸附的颗粒,其呈圆锥形,底部半径为15-25 nm,高度为2-4 nm。利用电化学石英晶体微量天平,通过检测循环伏安(CV)测量期间电极的同时质量变化,研究了铜溶解/沉积的中间体配合物。 CV曲线中的两个电流峰值说明了铜电极上中间络合物Cu〜+中心点Cl〜-中心点PEG的产生和消耗。

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