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Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm

机译:非晶硅铝酸盐纳米膜质子传导率的厚度依赖性

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摘要

AlxSi1-xOn films exhibit a drastic change of proton conductivity across the film by reducing their thickness to less than 100 nm. The temperature and humidity dependence of conductivity of the sub-100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-xOn films increases with decreasing the thickness.
机译:通过将AlxSi1-xOn膜的厚度减小到小于100 nm,它在整个膜上显示出质子传导率的急剧变化。 100 nm以下薄膜的电导率对温度和湿度的依赖性与较厚的薄膜完全不同。此外,在前一厚度范围内,电导率的值随着膜厚度的减小而显着增加,并且其厚度依赖性遵循幂定律,其固定指数为-2.1。这种尺寸缩放效应可以通过渗流电导模型来解释,即随着厚度的减小,AlxSi1-xOn膜中的导电部分渗流的可能性增加。

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