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Analysis of Si-F Bonds on Si(111) Surface by Electrochemical Method

机译:电化学法分析Si(111)表面的Si-F键

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Electrochemical current at Si(111) has been investigated in dilute HF solution as a function of surface pretreatment which controls the amount of Si-F bonds on the surface. When the partly F-covered surface is immersed in dilute HF solution, anodic current transient flows as the surface Si atoms bonded to F atoms dissolve into the solution and the surface is hydrogen terminated. The anodic current becomes very small if the F-covered surface is treated with oxygen-free water, which is effective for removing Si-F from the surface and for making a completely hydrogen-terminated Si(111) surface. All results suggest that the anodic current can be a good measure for the evaluation of a small amount of Si-F bonds on Si surfaces.
机译:已经研究了在稀HF溶液中Si(111)上的电化学电流随表面预处理的变化情况,该表面控制表面上Si-F键的数量。当部分覆盖有F的表面浸入稀HF溶液中时,随着与F原子键合的表面Si原子溶解到溶液中并且该表面被氢封端,阳极电流瞬态流动。如果用无氧水处理F覆盖的表面,则阳极电流会非常小,这对于从表面去除Si-F并制成完全氢封端的Si(111)表面是有效的。所有结果表明,阳极电流可以作为评估Si表面上少量Si-F键的好方法。

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