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Electric-Field-Induced Mass Movement of Ge_2Sb_2Te_5 in Bottleneck Geometry Line Structures

机译:电场在瓶颈几何线结构中引起的Ge_2Sb_2Te_5质量运动

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摘要

We report an electric-field-induced directional mass movement of Ge_2Sb_2Te_5 in bottleneck geometry. Under high-electric-stress circumstances (>10~6 A cm~-2), a mass of Ge_2Sb_2Te_5 tends to move toward the cathode (—) by the remaining mass depletion at the anode (+). The high electric stress induces an asymmetric compositional separation such that Sb is distributed toward the cathode (—) whereas Te is distributed toward the anode (+). Ionicity in Ge_2Sb_2Te_5 at high temperature and high electric stress can be one of the origins of the asymmetric behavior. The electric-field-induced mass movement may provide insight on the device reliability of phase-change random access memory.
机译:我们报告了在瓶颈几何形状中电场引起的Ge_2Sb_2Te_5定向质量运动。在高电应力的情况下(> 10〜6 A cm〜-2),由于阳极(+)上的剩余质量耗尽,Ge_2Sb_2Te_5的质量趋于向阴极(-)移动。高电应力引起不对称的成分分离,使得Sb朝向阴极(-)分布,而Te朝向阳极(+)分布。 Ge_2Sb_2Te_5在高温和高电应力下的离子性可能是不对称行为的起源之一。电场引起的质量运动可以提供有关相变随机存取存储器的设备可靠性的见解。

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