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The fabrication and characterization of a bismuth nanoparticle modified boron doped diamond electrode and its application to the simultaneous determination of cadmium(II) and lead(II)

机译:铋纳米粒子修饰的硼掺杂金刚石电极的制备,表征及其在同时测定镉和铅中的应用

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We report the simultaneous electroanalytical determination of Pb2+ and Cd2+ by square-wave anodic stripping voltammetry (SWASV) using a bismuth nanoparticle modified boron doped diamond (Bi-BDD) electrode. Bi deposition was performed in situ with the analytes, from a solution of 0.1 rnM Bi(NO3)(3) in 0.1 M HClO4, (pH 1.2), and gave detection limits of 1.9 mu g L-1 and 2.3 mu g L-1 for Pb(II) and Cd(II) respectively. Pb2+ and Cd2+ could not be detected simultaneously at a bare BDD electrode, whilst on a bulk Bi macro electrode (BiBE) the limits of detection for the simultaneous determination of Pb2+ and Cd2+ were ca. ten times higher. In situ atomic force microscopy (AFM) was performed to characterize the Bi nanoparticle growth on the BDD surface over a period of 120 s. The average final size of the Bi nanoparticles was 45 +/- 25 nm in height with a number density on the electrode surface of ca. 7 x 10(9) np/cm(2) obtained. The in situ AFM characterization suggests that the Bi nanoparticles are deposited by an "instantaneous" nucleation and growth mechanism.
机译:我们报告同时使用铋纳米粒子修饰的硼掺杂金刚石(Bi-BDD)电极通过方波阳极溶出伏安法(SWASV)同时进行Pb2 +和Cd2 +的电分析测定。从0.1 rnM Bi(NO3)(3)在0.1 M HClO4(pH 1.2)的溶液中用分析物原位进行Bi沉积,检测限为1.9μg L-1和2.3μgL- Pb(II)和Cd(II)分别为1。在裸露的BDD电极上无法同时检测到Pb2 +和Cd2 +,而在块状Bi宏电极(BiBE)上,用于同时测定Pb2 +和Cd2 +的检测极限大约为。高十倍。进行原位原子力显微镜(AFM)以表征Bi纳米粒子在120 s的时间内在BDD表面的生长。 Bi纳米粒子的平均最终尺寸为45 +/- 25 nm高,电极表面上的数密度约为1。获得7 x 10(9)np / cm(2)。原位原子力显微镜表征表明,Bi纳米颗粒是通过“瞬时”成核和生长机制沉积的。

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