Direct Measurements of Infrared Normal Spectral Emissivity of Solid Materials for High-Temperature Applications

摘要

A new facility for the measurement of the normal spectral emissivity of solid materials for high-temperature applications in the thermal steady state was developed at the Bundeswehr University of Munich. The measurements are performed under atmospheric conditions. The facility covers the temperature range between 500℃ and 1350℃ and wavelengths between 0.6 μm and 15 μm. The principle of operation involves the spectral comparison of a test sample with a reference blackbody and the sample surface temperature determination with a numerical spectral ratio calculation. The optical characteristics of the blackbody and the sample surface temperature determination are discussed in detail. Furthermore, measurement results of the quasi-reference material silicon-carbide under steady-state conditions are presented to validate the measurement method.