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Photophysics, photoelectrical properties and photoconductivity relaxation dynamics of quantum-sized bismuth(III) sulfide thin films

机译:量子尺寸硫化铋薄膜的光物理,光电特性和光电导弛豫动力学

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Electrical and photoelectrical properties (including both the stationary photoresponse and the photocarriers' relaxation dynamics) of nanocrystalline semiconducting bismuth(III) sulfide thin films were investigated. The experimental design of photoelectrical properties was achieved by controlling the chemistry of the deposition process (varying the reagent concentration in the reaction system) and also by physical means (controlling the crystal dimensions by post-deposition annealing). The band gap energy of thin films characterized by most pronounced photoelectrical properties was calculated, on the basis of measured photoconductivity spectral response curves, by several approaches. All of the obtained values are in very good agreement with the corresponding ones obtained from optical spectroscopy data within the framework of parabolic approximation for dispersion relation. On the basis of measured temperature dependence of dark electrical resistivity of nanocrystalline bismuth(III) sulfide films, the thermal band gap energy and the ionization energy of the impurity level (of donor type) were calculated. The corresponding values are 1.50 and 0.42 eV. Dynamics of non-equilibrium charge carriers' relaxation processes was studied with the oscilloscopic method. By analysis of the photoconductivity decay kinetics data it is found that recombination of non-equilibrium charge carriers is carried out according to the linear mechanism. The calculated relaxation time of photoexcited charge carriers is 1.58 ms, the relaxation processes occurring via local trapping centers. Recombination processes occurring via a single-type trapping center can be described within the framework of the Schockley-Read model. The practically linear regime detected in the measured lux-ampere characteristics of the studied films (Delta sigma similar to Phi(0.98)) indicate as well a linear recombination mechanism of the photoexcited charge carriers. (c) 2005 Published by Elsevier Inc.
机译:研究了纳米晶半导体硫化铋薄膜的电和光电性能(包括静态光响应和光载流子的弛豫动力学)。光电性能的实验设计是通过控制沉积过程的化学过程(改变反应体系中试剂的浓度)以及通过物理手段(通过沉积后退火控制晶体尺寸)来实现的。基于测得的光电导光谱响应曲线,通过几种方法计算了具有最显着的光电性能的薄膜的带隙能量。所有获得的值都与在色散关系的抛物线近似框架内从光谱数据获得的相应值非常吻合。根据测得的纳米级硫化铋(III)薄膜的暗电阻的温度依赖性,计算出了热能带隙能量和杂质能级(供体类型)的电离能。相应的值为1.50和0.42 eV。用示波法研究了非平衡载流子弛豫过程的动力学。通过对光电导衰减动力学数据的分析,发现非平衡电荷载流子的重组是根据线性机理进行的。计算出的光激发电荷载流子的弛豫时间为1.58 ms,该弛豫过程是通过局部陷阱中心发生的。通过单一类型的捕获中心发生的重组过程可以在Schockley-Read模型的框架内进行描述。在研究的薄膜的测得的勒-安特性中实际检测到的线性机制(Δσ与Phi(0.98)相似)也表明了光激发电荷载流子的线性重组机制。 (c)2005年由Elsevier Inc.发布。

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