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X-ray scattering studies of charge stripes in La2-xSrxNiO4 (x=0.20-0.33)

机译:La2-xSrxNiO4中电荷条纹的X射线散射研究(x = 0.20-0.33)

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The La2-xSrxNiO4 system is isostructural with the high T-C superconducting cuprate La2-xSrxCuO4 and is a prototypical system for the understanding of strongly correlated electron-phonon coupling, and the resultant effects on material properties. X-ray scattering studies have been performed on La5/3Sr1/3NiO4 that demonstrate the two-dimensional nature of these charge stripes. Such studies, demonstrate the very high correlation length of the stripes (similar to 2000 Angstrom) at low temperatures. We have undertaken a series of experiments measuring the wavevector and charge stripe correlation length an a variety of crystals with the compositions La2-xSrxNiO4 (x = 0.20, 0.25, 0.275, 0.30 and 0.33) using similar to 10 keV X-rays. The results demonstrate that for x = 0.275, and above, the charge stripes are highly correlated in a well-ordered crystalline lattice. Measurements of the incommensurability, c, as a function of temperature for the series revealed that it is commensurate and temperature independent for the x = 0.33 sample. For other compositions it is incommensurate and also temperature dependent. However for the x = 0.20 and 0.25 crystals a much reduced correlation length was observed suggestive of a charge stripe glass. However, such experiments are sensitive to such charge ordering only in the near (top few micron) surface region. High energy X-rays however can probe the charge stripe ordering within the bulk of the single crystal by utilising the dramatic increase in penetration depth. We have used 130 keV X-rays and demonstrate that in La5/3Sr1/3NiO4 the charge stripes are far less correlated in the bulk than in the near surface region. This reduced correlation length (similar to 300 Angstrom), consistent with neutron scattering measurements, is indicative of a charge stripe glass, reminiscent of that observed below x = 0.25, in the near surface region. [References: 15]
机译:La2-xSrxNiO4系统与T-C超导铜酸盐La2-xSrxCuO4具有同构结构,并且是原型系统,用于理解强相关的电子-声子耦合以及由此产生的对材料性能的影响。已经对La5 / 3Sr1 / 3NiO4进行了X射线散射研究,证明了这些电荷条的二维性质。这些研究表明,在低温下,条纹的相关长度非常高(类似于2000埃)。我们进行了一系列实验,使用类似于10 keV的X射线,测量了成分为La2-xSrxNiO4(x = 0.20、0.25、0.275、0.30和0.33)的各种晶体的波矢量和电荷条纹相关长度。结果表明,对于x = 0.275或更高,电荷条带在规则排列的晶格中高度相关。测量该系列的不可通量c与温度的关系,表明x = 0.33的样品是相称的且与温度无关。对于其他组合物,它是不相称的,并且还取决于温度。但是,对于x = 0.20和0.25晶体,观察到的相关长度大大减小,这表明带状电荷玻璃。然而,这样的实验仅在近(顶部几微米)表面区域中对这样的电荷排序敏感。但是,高能X射线可以利用穿透深度的急剧增加来探测单晶主体内的电荷条带排序。我们使用了130 keV X射线,证明在La5 / 3Sr1 / 3NiO4中,电荷条带在主体中的相关性远小于在近表面区域中。与中子散射测量结果一致的这种减小的相关长度(类似于300埃)表明电荷带状玻璃,使人联想到在近表面区域中在x = 0.25以下观察到的电荷带状玻璃。 [参考:15]

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