Reproducibility aspects of relative sensitivity factors for major and impurity elements in brass using secondary ion mass spectrometry

摘要

A set of experiments has been performed in which SIMS relative sensitivity factors (RSFs) of major and impurity elements in brass have been investigated. The attention has been focused upon the reproducibility of RSFs obtained by measuring M+ ions under oxygen bombardment and CsM+ ions under cesium bombardment. Both the magnitude of the uncertainties as well as the sources of their variation have been addressed. The data of the present study indicate that the reproducibility of relative sensitivity factors values for M+ and CsM+ ions in brass are statistically of the same magnitude. The largest source of variation arises from the sample exchange.