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首页> 外文期刊>Journal of mass spectrometry: JMS >A study of enhanced ion formation from metal-semiconductor complexes in atmospheric pressure laser desorption/ionization mass spectrometry
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A study of enhanced ion formation from metal-semiconductor complexes in atmospheric pressure laser desorption/ionization mass spectrometry

机译:常压激光解吸/电离质谱中金属-半导体配合物增强离子形成的研究

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摘要

The study of the key parameters impacted surface-assisted laser desorption/ionization-mass spectrometry is of broad interest. In previous studies, it has been shown that surface-assisted laser desorption/ionization-mass spectrometry is a complex process depending onmultiple factors. In the presented study, we showed that neither porosity, light absorbance nor surface hydrophobicity alone influence the enhancement phenomena observed from the hybrid metal-semiconductor complexes versus individual targets, but small changes in the analyte attaching to the target significantly affect laser desorption ionization-efficiency. By means of Raman spectroscopy and scanning electron microscopy, it was revealed that the formation of an amorphous analyte layer after drying on a solid substrate was essential for the enhanced laser desorption ionization-signal observed from the hybrid metal-semiconductor targets, and the crystallization properties of the analyte appeared as a function of the substrate. Obtained results were used for the screening of regular and lactose-free milk samples through the hybrid metal-semiconductor target. Copyright (C) 2016 John Wiley Sons, Ltd.
机译:影响表面辅助激光解吸/电离质谱的关键参数研究具有广泛的兴趣。在先前的研究中,已经表明表面辅助激光解吸/电离质谱是一个复杂的过程,取决于多种因素。在所提出的研究中,我们发现孔隙率、光吸光度和表面疏水性都不会单独影响从金属-半导体杂化配合物与单个靶材观察到的增强现象,但附着在靶材上的分析物的微小变化会显着影响激光解吸电离效率。通过拉曼光谱和扫描电子显微镜,发现在固体衬底上干燥后形成非晶态分析物层对于从金属-半导体杂化靶材上观察到的增强激光解吸电离信号至关重要,并且分析物的结晶性能表现为衬底的函数。所得结果用于通过杂化金属-半导体靶材筛选普通和无乳糖牛奶样品。版权所有 (C) 2016 John Wiley & Sons, Ltd.

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