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首页> 外文期刊>International Journal of Nanotechnology >Improved efficiency of InGaN/GaN light-emitting diodes with Al-doped zinc oxide using dual-plasma-enhanced metal-organic chemical vapour deposition system
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Improved efficiency of InGaN/GaN light-emitting diodes with Al-doped zinc oxide using dual-plasma-enhanced metal-organic chemical vapour deposition system

机译:使用双等离子体增强的金属有机化学气相沉积系统提高了掺铝氧化锌的InGaN / GaN发光二极管的效率

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摘要

We have reported aluminium doped zinc oxide (AZO) film grown on sapphire substrate using dual-plasma-enhanced metal-organic chemical vapour deposition (DPEMOCVD) system. The crystalline quality, surface morphology, optical properties, and electrical characteristic of AZO film depend on the deposition temperature and Al content. The 185℃-deposited and 2.88 at%-Al-doped AZO film shows a strong (002) diffraction peak intensity, flat surface morphology, high transmittance in visible range, and low resistivity. The PL peak of AZO film shows a blue-shift as compared to undoped ZnO film due to the Burstein-Moss (BM) effect. Finally, the AZO film was deposited on InGaN/GaN light-emitting diodes (LEDs) as transparent conductive layer (TCL). InGaN/GaN LED with optimal AZO TCL shows the lowest dynamic resistance, highest light output intensity, and narrowest full-width at half-maximum (FWHM) emitting spectrum as compared to those without TCL and with indium-tin-oxide (ITO).
机译:我们已经报道了使用双等离子体增强金属有机化学气相沉积(DPEMOCVD)系统在蓝宝石衬底上生长的铝掺杂氧化锌(AZO)膜。 AZO薄膜的晶体质量,表面形态,光学性质和电特性取决于沉积温度和Al含量。在185℃沉积且2.88 at%Al掺杂的AZO膜表现出强的(002)衍射峰强度,平坦的表面形态,可见光范围内的高透射率和低电阻率。与未掺杂的ZnO薄膜相比,由于Burstein-Moss(BM)效应,AZO薄膜的PL峰显示出蓝移。最后,将AZO膜沉积在InGaN / GaN发光二极管(LED)上作为透明导电层(TCL)。与不具有TCL和氧化铟锡(ITO)的InGaN / GaN LED相比,具有最佳AZO TCL的InGaN / GaN LED具有最低的动态电阻,最高的光输出强度以及在半最大(FWHM)发射光谱时最窄的全宽。

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