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首页> 外文期刊>Intermetallics >Characterization of suicide phases formed during pack siliconizing coating on the Nb-1Zr-0.1C alloy
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Characterization of suicide phases formed during pack siliconizing coating on the Nb-1Zr-0.1C alloy

机译:在Nb-1Zr-0.1C合金上进行填充硅化涂层过程中形成的硅化物相的表征

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The present paper describes the morphology, chemistry and crystallography of the phases observed in the silicide coatings produced by pack cementation technique on Nb based alloys. Cross-sectional microstructures examined by transmission electron microscopy and scanning electron microscopy techniques have shown that the coating has two silicide layers: NbSi2 and Nb5Si3. NbSi2 formed at the surface of the sample and Nb5Si3 formed in between the substrate (Nb alloy) and NbSi2 coating layer. Electron diffraction analyses revealed that NbSi2 has hexagonal crystal structure with lattice parameters as a = 0.48 nm and c = 0.66 nm and Nb5Si3 has tetragonal crystal structure with lattice parameters as a = 0.65 nm and c = 1.19 nm. Nb5Si3 showed fine equiaxed grains, whereas, NbSi2 exhibited duplex morphology having columnar grain morphology near to the Nb5Si3 layer and large equiaxed grains at the surface of the coating sample. The presence of duplex morphology was explained by estimating diffusion of various species and it was shown that columnar morphology of grains could be attributed to outward diffusion of Nb and equiaxed grains to inward diffusion of Si. In the case of Nb5Si3, growth takes place due to single element Si diffusion, leading to development of single equiaxed grain morphology of the Nb5Si3 phase. (C) 2015 Elsevier Ltd. All rights reserved.
机译:本文介绍了在Nb基合金上通过填充胶结技术生产的硅化物涂层中观察到的相的形态,化学和晶体学。通过透射电子显微镜和扫描电子显微镜技术检查的横截面显微结构表明,该涂层具有两个硅化物层:NbSi2和Nb5Si3。 NbSi2形成在样品的表面,Nb5Si3形成在基板(Nb合金)和NbSi2涂层之间。电子衍射分析显示,NbSi2具有晶格参数为a = 0.48 nm和c = 0.66 nm的六方晶体结构,Nb5Si3具有晶格参数为a = 0.65 nm和c = 1.19 nm的四方晶体结构。 Nb5Si3表现出细等轴晶粒,而NbSi2表现出双相形态,在Nb5Si3层附近具有柱状晶粒形态,涂层样品表面具有大等轴晶粒。通过估计各种物种的扩散来解释双相形态的存在,结果表明,晶粒的柱状形态可以归因于Nb的向外扩散,而等轴晶粒归因于Si的向内扩散。在Nb5Si3的情况下,由于单元素Si的扩散而发生生长,从而导致Nb5Si3相的单等轴晶粒形貌发展。 (C)2015 Elsevier Ltd.保留所有权利。

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