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Development of a two dimensional scanning Seebeck coefficient measurement system by a micro-probe method

机译:用微探针法开发二维扫描塞贝克系数测量系统

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A Seebeck micro-probe measurement system with high spatial resolution has been developed to examine two-dimensional spatial distribution of Seebeck coefficient for thermoelectric materials at room temperature. A contact area of 10 μmΦ is realized by using a Copper probe tip fabricated by a mechanical machining process. The two-dimensional spatial distribution of the Seebeck coefficient for the Bismuth —Telluride and Zinc—Antimonide systems has been measured. The sign inversion of the Seebeck coefficient from p- to n-type is clearly detected along the crystal growth direction in the Bismuth-Telluride system. On the other hand, the anisotropic Seebeck coefficient reflecting grain distribution is conspicuously observed in the Zinc—Antimonide system.
机译:开发了具有高空间分辨率的Seebeck微探针测量系统,以检查室温下热电材料的Seebeck系数的二维空间分布。通过使用通过机械加工工艺制造的铜探针,可实现10μmΦ的接触面积。已经测量了铋-碲化物和锌-锑化物系统的塞贝克系数的二维空间分布。在铋-碲化物体系中,沿着晶体生长方向可以清楚地检测到塞贝克系数从p型到n型的符号反转。另一方面,在锌-锑化物体系中观察到了反映晶粒分布的各向异性塞贝克系数。

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