Microstructure and thermoelectric properties of Sb doped Hf0.25Zr0.75NiSn Half-Heusler compounds with improved carrier mobility

摘要

Half-Heusler (HH) semiconductor alloys are being widely investigated due to their promising potential for thermoelectric (TE) power generation applications. Sb is an effective doping element for n-type ZrNiSn half-Heuslers alloys. HH thermoelectric materials Hf0.25Zr0.75NiSn1-xSbx (0 <= x <= 0.03) were synthesized by induction melting combined with plasma activated sintering (PAS) technique. X-ray diffraction concluded that single-phase HH compounds without compositional segregations were obtained. Presence of bended lamellar structures was revealed by the FESEM. Sb doping significantly enhanced the electrical conductivity, power factor and carrier concentration of the alloys. An increase in the carrier mobility was also observed. Consequently, optimum values of 4.36 x 10(-3) W/mk(2) and 4.7 x 10(20) cm(-3) were achieved for power factor and carrier concentration, respectively. As a result, a ZT value of 0.83 at 923 K was obtained which is about 67% improvement compared to the un-doped sample. (C) 2016 Elsevier Ltd. All rights reserved.