An Apparatus for Measuring the Electric Conductivity and Thermal EMF of Semiconductors and Their Melts

摘要

An apparatus for investigating the thermoelectric characteristics of semiconductors and chemically corrosive semiconductor melts inclined to evaporation and decomposition in a wide temperature range of 300-1300 K is developed and constructed. In contrast to the devices used earlier for this purpose, the electric conductivity and thermal emf are measured in hermetically sealed autoclaves, which, after being evacuated to a pressure of 1.33 × 10{sup}(-2) Pa, are filled with spectrally pure argon for preventing the oxidation, evaporation, or decomposition of the substance under study. The errors of the electric-conductivity and thermal-emf measurements at 1000 K do not exceed 4 and 6%, respectively.