Quantitative Measurement of Dielectric Properties Using Scanning Nonlinear Dielectric Microscopy with Electro-conductive Cantilever

摘要

A quantitative measurement method of the linear and nonlinear dielectric constant using cantilever-type scanning nonlinear dielectric microscopy (SNDM) is reported. Using this method, we succeed in quantitatively measuring the linear dielectric constant distribution of TiO_2-Bi_2Ti_4O_(11) ceramics and nonlinear dielectric constant of LiTaO_3 single crystal.