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首页> 外文期刊>Implant dentistry >Implant-Abutment Contact Surfaces and Microgap Measurements of Different Implant Connections Under 3-Dimensional X-Ray Microtomography
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Implant-Abutment Contact Surfaces and Microgap Measurements of Different Implant Connections Under 3-Dimensional X-Ray Microtomography

机译:三维X射线显微断层摄影术中不同种植体连接的种植体-基台接触面和微间隙测量

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摘要

Purpose: The presence of a microgap between implant and abutment could produce a bacterial reservoir which could interfere with the longterm health of the periimplant tissues. The aim of this article was to evaluate, by x-ray 3-dimensional microtomography, implant-abutment contact surfaces and microgaps at the implant-abutment interface in different types of implant-abutment connections.
机译:目的:在植入物和基台之间存在微间隙可能会产生细菌储库,从而可能干扰植入物周围组织的长期健康。本文的目的是通过X射线3维显微断层扫描技术评估不同类型的种植体-基台连接中的种植体-基台接触面和种植体-基台界面处的微间隙。

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