...
首页> 外文期刊>Atomic Spectroscopy >Development of an ICP-AES-based Method for the Trace Level Determination of Common Analytes in a Thorium Matrix Without Chemical Separation
【24h】

Development of an ICP-AES-based Method for the Trace Level Determination of Common Analytes in a Thorium Matrix Without Chemical Separation

机译:基于ICP-AES的痕量水平测定a基质中常见分析物无需化学分离的方法的开发

获取原文
获取原文并翻译 | 示例

摘要

Generally, ICP-AES-based methods for trace metal assay of nuclear materials require prior separation of the major matrix to avoid spectral interference from an emission-rich matrix like U, Pu, Zr, Th, Am, etc. In the present work, an attempt was made to develop a methodology for the direct determination of analytes in a thorium matrix without any chemical separation. This study includes the systematic investigation of the spectral interference of Th on the different analytical lines of Al, Ba, Bi, Ca, Ga, In, Mg, Na, Pb, Sr, Co, Cr, Cu, Fe, Mn, and Ni. Due to the advancement of the CCD-based detector, the option of choosing alternative/additional analytical lines increases, which in turn helps in identifying relatively interference-free analytical lines for the selected elements. Sometimes the least interfered lines may not show the best analytical performance; hence, the analytical performance of these analytical lines was investigated.
机译:通常,基于ICP-AES的核材料痕量金属分析方法需要事先分离主要基质,以避免来自富发射基质(如U,Pu,Zr,Th,Am等)的光谱干扰。在当前工作中,尝试开发一种无需任何化学分离即可直接测定a基质中分析物的方法。这项研究包括对Th在Al,Ba,Bi,Ca,Ga,In,Mg,Na,Pb,Sr,Co,Cr,Cu,Fe,Mn和Ni的不同分析线上的光谱干扰的系统研究。由于基于CCD的检测器的发展,选择替代/附加分析线的选择增加了,这反过来有助于为所选元素识别相对无干扰的分析线。有时,受干扰最少的谱线可能无法显示出最佳的分析性能。因此,对这些分析线的分析性能进行了研究。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号