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Matrix Elimination Ion Chromatography Method for the Determination of Trace Levels of Anionic Impurities in High Purity Cesium Iodide

机译:基质消除离子色谱法测定高纯碘化铯中痕量阴离子杂质

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摘要

In the present study an ion chromatographic method based on matrix elimination has been developed for the determination of anionic impurities in high purity cesium iodide crystals. The presence of impurities has a detrimental effect on the characteristics of detectors based on cesium iodide crystals. In particular, oxygen-containing anions inhibit the resolving power of scintillators and decrease the optical absorption. The quantitative determination of anions (fluoride, chloride, bromide, nitrate, phosphate, and sulphate) simultaneously in the high-purity cesium iodide crystals has not been carried out before. The large concentration of iodide poses a challenge in the determination of anions (especially phosphate and sulphate); hence, matrix elimination is accomplished by adopting a sample pretreatment technique. The method is validated for linearity, accuracy, and precision. The limit of detection for different anions is in the range of 0.3–3 µg/g, and the relative standard deviation is in the range of 4–6% for the overall method.
机译:在本研究中,已开发出一种基于基质消除的离子色谱法,用于测定高纯度碘化铯晶体中的阴离子杂质。杂质的存在会对基于碘化铯晶体的检测器的特性产生不利影响。特别地,含氧阴离子抑制了闪烁体的分辨能力并降低了光吸收。以前从未对高纯度碘化铯晶体中的阴离子(氟离子,氯离子,溴离子,硝酸根,磷酸根和硫酸根)同时进行定量测定。高浓度的碘化物对阴离子(尤其是磷酸根和硫酸根)的测定提出了挑战。因此,通过采用样品预处理技术可实现基质消除。验证了该方法的线性,准确性和精确度。对于整个阴离子,不同阴离子的检出限在0.3–3 µg / g范围内,相对标准偏差在4–6%范围内。

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