Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing - type NDT

摘要

This work deals with the inverse problem associated to 3D crack identification inside a conductive material using eddy current measurements. In order to accelerate the time-consuming direct optimization, the reconstruction is provided by the minimization of a last-square functional of the data-model misfit using space mapping (SM) methodology. This technique enables to shift the optimization burden from a time consuming and accurate model to the less precise but faster coarse surrogate model. In this work, the finite element method (FEM) is used as a fine model while the model based on the volume integral method (VIM) serves as a coarse model. The application of the proposed method to the shape reconstruction allows to shorten the evaluation time that is required to provide the proper parameter estimation of surface defects.