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Solution-processed transparent p-type orthorhombic K doped SnO films and their application in a phototransistor

机译:溶液处理透明p型斜方晶系K掺杂SnO薄膜及其在光电晶体管中的应用

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The exploitation of p-type oxide semiconductors with excellent optoelectrical properties as well as a simple preparation process is still challenging owing to the difficulty in producing hole carriers which results from strong hole localization in p-type oxide semiconductors. In this work, we succeeded in using ethylene glycol as a reductant to prepare orthorhombic structure SnO films using a sol–gel method and through K doping the optical and electrical properties of the films were improved. When the orthorhombic K doped SnO (K-SnO) films were applied in a phototransistor, it presented ultra-broadband photosensing from the ultraviolet to infrared region (300–1000 nm), demonstrating a photoresponsivity of 349 A W−1 and a detectivity of 5.45 × 1012 Jones at 900 nm under a light intensity of 0.00471 mW cm−2. In particular, infrared photosensing was for the first time reported in the SnO based phototransistors. This work not only provides a simple method to fabricate high-performance and low-cost p-type K-SnO films and phototransistors, but may also suggest a new way to improve the p-type characteristics of other oxide semiconductors and devices.
机译:p型半导体氧化物的剥削具有优良的optoelectrical性能作为一个简单的制备过程挑战由于生产困难强劲的洞洞运营商的结果本地化在p型半导体氧化物。这个工作,我们成功地使用乙二醇作为还原剂为斜方晶系的结构使用溶胶-凝胶法和K SnO电影掺杂的光学和电学性质电影被改善。掺杂SnO (K-SnO)被应用于电影光电晶体管,它提出了ultra-broadband从紫外到红外光敏地区(300 - 1000 nm),展示photoresponsivity 349 W−1和探测能力5.45×1012琼斯在900海里的光强度0.00471 mW厘米−2。红外光敏是第一次报告的SnO光电晶体管。工作不仅提供了一个简单的方法制造高性能和低成本的p型K-SnO电影和光电晶体管,但也可以建议一种新的方式来提高p型氧化物半导体和其他的特征设备。

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