首页> 外文期刊>Electronics Newsweekly >'Material Handling System And Monitoring System And Monitoring Method For Particles In Traveling Area Of Overhead Hoist Transfers' in Patent Application Approval Process (USPTO 20230138019)
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'Material Handling System And Monitoring System And Monitoring Method For Particles In Traveling Area Of Overhead Hoist Transfers' in Patent Application Approval Process (USPTO 20230138019)

机译:“高架提升机转运行进区颗粒物的物料搬运系统及监测方法”在专利申请审批程序中(美国专利商标局20230138019)

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The following quote was obtained by the news editors from the background information suppliedby the inventors: “Semiconductor manufacturing has very strict requirements on cleanliness, and theenvironmental cleanliness in a wafer factory is 1,000, that is, there shall be no more than 1,000 particleswith a diameter of 0.1 mm D 0.3 mm in 1 m~3 space. The requirements for the internal environment of aprocess machine are even more stringent, with a cleanliness of 10. Thus, it is very important to test andcontrol particles in semiconductor industry. A traditional automatic material handling system comprisesoverhead hoist transfers (OHT) and tracks, and traveling wheels of each OHT move along the tracks tohandle wafers. In order to ensure cleanliness, the tracks and the OHTs are generally cleaned on a regularbasis or in case of fault alarm.”
机译:以下报价是获得的消息编辑的背景资料提供生产有非常严格的要求清洁,晶圆厂是1000年,也就是说,必有不超过1000的微粒在1米~ 3 D 0.1毫米0.3毫米的空间。的内部环境更严格的,清洁的10. 和传统的自动物料搬运系统包括跟踪,每个OHT和旅行轮子移动沿着铁轨确保清洁、轨道和OHTs通常定期清洗故障报警。”

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    《Electronics Newsweekly》 |2023年第23期|937-940|共4页
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