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首页> 外文期刊>Applied optics >TWO-WAVELENGTH LASER-DIODE INTERFEROMETER WITH FRACTIONAL FRINGE TECHNIQUES
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TWO-WAVELENGTH LASER-DIODE INTERFEROMETER WITH FRACTIONAL FRINGE TECHNIQUES

机译:带有分形条纹技术的两波长激光二极管干涉仪

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A two-wavelength interferometer with a fractional fringe technique (the method of coincidence) has been constructed by using dual frequency-ramped laser diodes. The respective wavelengths of two optical phases were measured by the heterodyne technique. The detected two phases are employed with real-time electronic processing to produce two signals that correspond to the integer and the fractional fringe numbers at a single wavelength. These summed signals can yield a synthetic phase having a single-wavelength resolution. The upper Limits for the measurement accuracy are theoretically analyzed. [References: 15]
机译:通过使用双频斜坡激光二极管,构造了具有分数条纹技术(符合方法)的两波长干涉仪。通过外差技术测量两个光学相的各自的波长。所检测的两个相位与实时电子处理一起使用,以产生两个信号,它们对应于单个波长的整数和分数条纹数。这些求和的信号可以产生具有单波长分辨率的合成相位。从理论上分析了测量精度的上限。 [参考:15]

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