首页> 外文期刊>Applied optics >Calibration method of the specific characteristic of an electronic system of a rotating-analyzer ellipsometer
【24h】

Calibration method of the specific characteristic of an electronic system of a rotating-analyzer ellipsometer

机译:旋转分析仪椭圆仪电子系统特定特性的校准方法

获取原文
获取原文并翻译 | 示例
           

摘要

In photometric ellipsometry the optical signal is transformed into an electrical signal by a photodetector, and it passes an electronic system to reduce the noise and to amplify the signal. But inherently it will induce a phase shift. and an amplitude attenuation of the output signal. Such a specific characteristic of an electronic system depends on the angular frequency of the signal and gives systematic errors to the results of the measurement of rotating-analyzer ellipsometry. We propose a modified method of measurement that enables us to calibrate the electronic system in the ellipsometric measurement configuration. (C) 1997 Optical Society of America.
机译:在光度椭圆仪中,光信号通过光电探测器转换为电信号,并通过电子系统以降低噪声并放大信号。但从本质上讲,它将引起相移。和输出信号的幅度衰减。电子系统的这种特定特性取决于信号的角频率,并且会给旋转分析仪椭圆偏光法的测量结果带来系统误差。我们提出了一种改进的测量方法,该方法使我们能够在椭偏测量配置中校准电子系统。 (C)1997年美国眼镜学会。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号