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Scalability analysis of diffractive optical element-based free-space photonic circuits for interoptoelectronic chip interconnections

机译:基于衍射光学元件的自由空间光子电路在光电芯片互连中的可扩展性分析

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摘要

An interchip free-space optical interconnection module is investigated to solve the pin-input-output bottleneck at the interface of silicon integrated circuits. The scalability of the photonic circuit is theoretically analyzed by use of the minimum feature size requirement of each diffractive element used. The study showed that interconnection densities of 1000-2000 channels/cm is possible for a 40-mm interconnection length with a 3-mm-thick optical substrate. Diffraction-limited imaging capability has been demonstrated using a fabricated prototype, confirming its applicability for interchip free-space interconnections. Photonic circuit insertion losses of -23.4 dB for TE polarization and -25.9 dB for TM polarization as well as a polarization-dependent loss of 2.5 dB are found to be caused primarily by a pair of binary linear gratings used for beam deflections. Design modifications aiming at insertion loss reduction and further improvement of tolerance capabilities are also discussed.
机译:研究了一种芯片间自由空间光互连模块,以解决硅集成电路接口处的引脚输入-输出瓶颈。理论上通过使用所使用的每个衍射元件的最小特征尺寸要求来分析光子电路的可扩展性。研究表明,对于40mm的互连长度和3mm厚的光学基板,互连密度为1000-2000通道/ cm是可能的。衍射极限成像功能已使用预制原型进行了演示,证实了其在芯片间自由空间互连中的适用性。发现TE偏振光子电路插入损耗为-23.4 dB,TM偏振光子电路插入损耗为-25.9 dB,与偏振有关的损耗为2.5 dB,这主要是由用于光束偏转的一对二进制线性光栅引起的。还讨论了旨在减少插入损耗和进一步提高公差能力的设计修改。

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