...
首页> 外文期刊>Applied optics >Improvements in the accuracy and the repeatability of long trace profiler measurements
【24h】

Improvements in the accuracy and the repeatability of long trace profiler measurements

机译:改进长轨迹分析器测量的准确性和可重复性

获取原文
获取原文并翻译 | 示例

摘要

Modifications of the long trace profiler at the Advanced Photon Source at Argonne National Laboratory have significantly improved its accuracy mad repeatability for measuring the figure of large fiat and long-radius mirrors. Use ora Dove prism in the reference beam path corrects phasing problems between mechanical errors and thermally induced system errors. A single reference correction now completely removes both of these error signals from the measured surface profile. The addition of a precision air conditioner keeps the temperature in the metrology enclosure constant to within ±0.1 ℃ over a 24-h period and has significantly improved the stability and the repeatability of the measurements. Longradius surface curvatures can now be measured absolutely with a high degree of confidence. These improved capabilities are illustrated with a series of measurements of a 500-mm-long mirror with a 5-kin radius of curvature. The standard deviation in the average often slope profile scans is 0.3 μrad, and the corresponding standard deviation in the height error is 4.6 nm.
机译:在Argonne国家实验室的Advanced Photon Source上对长迹线轮廓仪进行了修改,极大地提高了其精确度和可重复性,可用于测量大法线和长半径镜面的图形。在参考光束路径中使用ora Dove棱镜可纠正机械误差和热引起的系统误差之间的相位问题。现在,一次参考校正即可从测量的表面轮廓中完全消除这两个误差信号。添加精密空调可在24小时内将计量外壳中的温度保持恒定在±0.1℃以内,并显着提高了测量的稳定性和可重复性。现在可以绝对高度可靠地测量长半径表面曲率。通过对具有5 kin曲率半径的500毫米长的反射镜进行一系列测量来说明这些改进的功能。平均斜率轮廓扫描的标准偏差为0.3μrad,相应的高度误差标准偏差为4.6 nm。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号