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Influence of Temperature in Scattered SiNW MOSFET

机译:温度的影响分散SiNW MOSFET

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abstract_textpThe impact of temperature in carrier transport of scattered SiNW MOSFET has been developed. Scattered SiNW MOSFET model includes the effects of elastic scattering, optical phonon emission, surface roughness scattering and random discrete dopants. The temperature effect of above mentioned scatterings in the device limits electron mobility, decreasing device current and transconductance. This work discusses the detailed behavior of analog parameters like transconductance (g(m)) and early voltage (V-A). The validity of the proposed model has been confirmed by comparing the analytical results with the technology computer aided design simulation results./p/abstract_text
机译:& abstract_text & p所带来的影响温度在承运人运输的分散SiNW MOSFET。MOSFET模型包括弹性的影响散射、光学声子发射、表面粗糙散射和随机离散掺杂物。上述的温度效应散射电子设备的限制当前和流动性,减少设备跨导。详细的行为模拟参数跨导(g (m))和电压(v a)。该模型的有效性通过比较分析结果确认计算机辅助设计与技术模拟结果。;/ p & / abstract_text

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