High Precision in Raman Frequency Achieved Using Real-Time Calibration with a Neon Emission Line: Application to Three-Dimensional Stress Mapping Observations

摘要

A three-dimensional (3D) Raman mapping system with a real-time calibration function was developed for detecting stress distributions in solid materials from subtle frequency shifts in Raman spectra. An atomic emission line of neon at 918.3 cm~(-1) when excited at 514.5 nm was used as a wavenumber standard. An emission spectrum of neon and a Raman spectrum from a sample were introduced into a single polychromator using a bifurcated optical fiber. These two spectra were recorded simultaneously on a charge-coupled device (CCD) detector using double-track mode. Energy deviation induced by the fluctuation of laboratory temperature, etc., was removed effectively using the neon emission line. High stability during long measurements was achieved. By applying curve fitting, positions of the Raman line were determined with precision of about 0.05 cm~(-1). The present system was applied to measurements of residual pressure around mineral inclusions in a natural diamond: 3D stress mapping was achieved.