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首页> 外文期刊>Analytica chimica acta >Flow injection discrimination of the chloride interference with Cu(II) electrode function of chalcogenide based solid-state copper ion-selective electrodes
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Flow injection discrimination of the chloride interference with Cu(II) electrode function of chalcogenide based solid-state copper ion-selective electrodes

机译:硫族化物型固态铜离子选择性电极的氯离子干扰Cu(II)电极功能的流动注射判别

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The paper outlines the analytical applicability of the flow injection dynamic approach to suppressing the chloride interference with chalcogenide based Cu-ISEs on the example of two different membrane compositions of the now-injection potentiometric (FIP) detectors, Cu2-xSe and CuAgSe. The presence of chloride in the injected copper(II) standards is manifested by the appearance of two consecutive peaks in the output transient signal, the first of which, below the baseline, proves to be reciprocally dependent on the C-Cu(II)/CCl- ratio in the sample. Through a detailed examination of the factors controlling this complex profile of the output signal, conditions have been found, under which a kinetic separation of the reactions governing the dynamic response to Cu(II) in the presence and absence of chloride becomes possible. The new approach is technically simple, highly reproducible and does not perturb the sample speciation. Cu(II) concentrations down to 5 x 10(-6) M in non-buffered solutions and 1 x 10(-9) M in copper-methionine ion-buffers can be determined in the presence of up to 1 M KCl. A mechanism of the chloride discrimination is proposed. According to this mechanistic scheme the chloride discrimination is mainly controlled by two inter-dependent events occurring in the detector cell: (i) the continuous increase of the C-Cu(II)/CCl- ratio at the membrane surface, resulting from the fast desorption of chloride and (ii) the ability of the ion-selective membrane to rapidly respond to this change. The postulated mechanistic scheme is supported by analysis of the transient signals obtained for both Cu(II) and Cl- ions employing a multi-ion sensor detector with Cu2-xSe- and AgCl-electroplated membranes incorporated in series. (C) 1998 Elsevier Science B.V. [References: 29]
机译:本文以现在注入电位(FIP)检测器的两种不同膜组成Cu2-xSe和CuAgSe的实例为例,概述了流动注入动力学方法抑制氯化物对硫族化物基Cu-ISE的干扰的分析适用性。注入的铜(II)标准液中存在氯化物,这表现为在输出瞬态信号中出现了两个连续的峰,其中第一个峰低于基线,被证明与C-Cu(II)/样品中的CCl-比。通过详细检查控制输出信号复杂曲线的因素,发现了条件,在这种条件下,在存在和不存在氯化物的情况下,动态分离控制对Cu(II)的动态响应的反应成为可能。新方法技术上简单,可重复性高,并且不会干扰样品的形成。在高达1 M KCl的存在下,可以确定在非缓冲溶液中的Cu(II)浓度低至5 x 10(-6)M,在铜-蛋氨酸离子缓冲剂中的Cu(II)浓度低至1 x 10(-9)M。提出了氯化物鉴别的机理。根据这种机制,氯化物的鉴别主要受检测器池中发生的两个相互依存的事件控制:(i)膜表面C-Cu(II)/ CCl-比的连续增加是由于快速氯离子的解吸和(ii)离子选择性膜快速响应此变化的能力。通过使用具有串联结合的Cu2-xSe和AgCl电镀膜的多离子传感器检测器,对Cu(II)和Cl-离子获得的瞬态信号进行分析,可以支持所提出的机理方案。 (C)1998 Elsevier Science B.V. [参考:29]

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