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首页> 外文期刊>Analytical Letters >U CHARACTERIZATION OF RHENIUM(V) COMPLEXES WITH PHENOLS USING MASS SPECTROMETRY WITH SELECTED SOFT IONIZATION TECHNIQUES
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U CHARACTERIZATION OF RHENIUM(V) COMPLEXES WITH PHENOLS USING MASS SPECTROMETRY WITH SELECTED SOFT IONIZATION TECHNIQUES

机译:质谱-质谱联用选择性软电离技术对铀(V)配合物与酚的U表征

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摘要

The synthesis, characterization, and mass spectra of oxorhenium(V) complexes with 1,2-dihydroxybenzene, 1,2,3-trihydroxybenzene, and 2,3-dihydroxynaphtalene are reported. Electrospray ionization, atmospheric pressure photoionization, and laser desorption/ionization mass spectra of the complexes showed abundant negatively charged molecular anions and low fragmentation. Calculated similarity indexes showed significant conformity between the computed and experimental isotopic patterns of selected ions and confirmed correct assignment of elemental composition to m/z values. Electrospray tandem mass spectrometry provided essential information about fragments from molecular ions of studied complexes, making it possible to distinguish among fragment ions and the ions arising from compounds present in the reaction mixture. Based on the results, mass spectrometry utilizing soft common ionization techniques is useful for monitoring complex formation reaction kinetics and the stabilities of the complexes. Representative spectra were recorded for micromolar concentrations of the analytes.
机译:报道了with与1,2-二羟基苯,1,2,3-三羟基苯和2,3-二羟基萘的配合物的合成,表征和质谱。配合物的电喷雾电离,大气压光电离和激光解吸/电离质谱显示出大量带负电荷的分子阴离子和低碎片。计算出的相似性指数显示出所选离子的计算同位素模式和实验同位素模式之间具有显着的一致性,并确认元素组成正确分配至m / z值。电喷雾串联质谱法提供了有关所研究复合物分子离子碎片的基本信息,从而可以区分碎片离子和反应混合物中存在的化合物产生的离子。基于这些结果,利用软通用电离技术的质谱法可用于监测复合物形成反应动力学和复合物的稳定性。记录代表性光谱的分析物的微摩尔浓度。

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