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Development of Ion Drift-Chemical lonization Mass Spectrometry

机译:离子漂移化学电离质谱的发展

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An ion drift-chemical ionization mass spectrometry (ID-CIMS) technique has been developed to detect and quantify trace gases,including volatile organic compounds and inorganic species.The trace species are chemically ionized into positive or negative product ions with a well-controlled ion-molecule reaction time.The ID-CIMS method allows for quantification of the trace gases without the necessity of performing calibrations with authentic standards for the trace gases.Demonstrations of the ability of ID-CIMS to accurately quantify isoprene and HNO_3 in a laboratory setting are presented.The results illustrate that the ID-CIMS technique facilitates detection and quantification of organic and inorganic species in laboratory kinetic investigations and field measurements.
机译:已开发出一种离子漂移化学电离质谱(ID-CIMS)技术来检测和定量分析痕量气体,包括挥发性有机化合物和无机物,并通过控制良好的离子将痕量物化学化为正或负产物离子。分子反应时间.ID-CIMS方法无需对真实的痕量气体标准进行校准即可对痕量气体进行定量分析,证明了ID-CIMS在实验室环境中准确定量异戊二烯和HNO_3的能力。结果表明,ID-CIMS技术有助于实验室动力学研究和现场测量中有机和无机物质的检测和定量。

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