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Development of ion drift-chemical ionization mass spectrometry

机译:离子漂移化学电离质谱的发展

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An ion drift-chemical ionization mass spectrometry (ID-CIMS) technique has been developed to detect and quantify trace gases, including volatile organic compounds and inorganic species. The trace species are chemically ionized into positive or negative product ions with a well-controlled ion-molecule reaction time. The ID-CIMS method allows for quantification of the trace gases without the necessity of performing calibrations with authentic standards for the trace gases. Demonstrations of the ability of ID-CIMS to accurately quantify isoprene and HNO3 in a laboratory setting are presented. The results illustrate that the ID-CIMS technique facilitates detection and quantification of organic and inorganic species in laboratory kinetic investigations and field measurements.
机译:已经开发出一种离子漂移化学电离质谱技术(ID-CIMS)来检测和量化痕量气体,包括挥发性有机化合物和无机物。痕量物质以可控的离子分子反应时间被化学离子化为正或负的产物离子。 ID-CIMS方法允许对痕量气体进行定量,而无需使用痕量气体的真实标准品进行校准。展示了ID-CIMS在实验室环境中准确定量异戊二烯和HNO3的能力。结果表明,ID-CIMS技术有助于实验室动力学研究和现场测量中有机和无机物质的检测和定量。

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