首页> 外文期刊>Applied radiation and isotopes: including data, instrumentation and methods for use in agriculture, industry and medicine >Measurement of large angle Rayleigh scattering cross sections for 39.5, 40.1 and 45.4 keV photons in elements with 26 <= Z <= 83
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Measurement of large angle Rayleigh scattering cross sections for 39.5, 40.1 and 45.4 keV photons in elements with 26 <= Z <= 83

机译:用26 <= Z <= 83的元素中的39.5,40.1和45.4keV光子测量39.5,40.1和45.4keV光子的测量

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摘要

The present work reports Rayleigh scattering cross section measurements for the 39.5 keV (Sm- K alpha(2)), 40.1 keV (Sm-K alpha(1)) and 45.4 keV (Sm-K beta 1,3) X-ray photons in 35 elements with 26 <= Z <= 83 at backward angle of 139 degrees. The scattering measurements were performed in reflection mode geometrical set up involving a secondary photon source consisting of Samarium (Sm-62) target excited by the 59.54 keV gamma-rays from the Am-241 radioactive source. The scattered photons were detected using a low energy germanium (LEGe) detector. The product of detector efficiency, intensity of incident photons and other geometrical factors were determined by measuring the K X-ray yields from targets with 47 <= Z <= 59 and knowledge of the respective K X-ray fluorescence cross sections. The measured cross sections are compared with the theoretical cross sections based on the modified form factor (MF) formalisms and the second-order S-matrix approach. The experimental results demonstrate large deviations from the MF values for the elements with K shell binding energy (B-K) in vicinity of the incident photon energy (E-in), which smooth out with inclusion of the anomalous scattering factors (ASFs). The S-matrix values, in general, agree with the measured cross sections for all the elements under investigation.
机译:目前的工作报告了39.5keV(SM-Kα(2)),40.1keV(SM-Kα(1))和45.4keV(SM-kβ1,3)X射线光子的瑞利散射横截面测量在35个元素中,以139度的后角度为26 <= z <= 83。在反射模式几何建立中进行散射测量,涉及由来自AM-241放射源的59.54keVγ射线激发的钐(SM-62)靶组成的二次光子源。使用低能量锗(Lege)检测器检测散射的光子。通过测量来自47 <= Z <= 59的靶标的K X射线产量和各自的K X射线荧光横截面的知识来确定检测器效率,入射光子和其他几何因子的乘积。将测量的横截面与基于修饰的外形(MF)形式和二阶S矩阵方法进行比较。实验结果表明,与k壳结合能量(B-k)的元素的MF值脱离了入射光节能量(E-in)附近的大偏差,其与包含异常散射因子(ASF)的含有液相传。通常,S矩阵值与正在调查的所有元素的测量横截面同意。

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