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Damage study of irradiated tungsten and copper using proton and argon ions of a plasma focus device

机译:使用质子和氩离子的抗钨和铜的损伤研究等离子体聚焦装置

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The destructive effects of proton and argon ions produced in a low energy plasma focus device on the surface of tungsten and copper were investigated. Optical microscopy, SEM, EDX, XRD and ERD analysis were performed for initial and irradiated samples. The results showed that total thermal impact under the irradiation by argon is much more significant than that by hydrogen. Sub-micrometer blisters, clusters of joined bubbles and rupture patterns were observed on the surface of copper after irradiation by argon. Micro-cracks were observed on the tungsten samples irradiated by argon, which indicate fast annealing of the molten surface. Many dense blisters and evidence of ion sputtering were observed on the surfaces irradiated by protons. Results of ERD analysis showed that the highest concentration of hydrogen is 24% in the second layer and at a depth of 20-55 nm from the tungsten surface. In the copper sample, the highest density of hydrogen was found to be 23% in the second layer and at a depth of 28-68 nm. Also, the highest penetration depth of protons into the tungsten and copper samples was 118 nm and 160 nm, respectively.
机译:研究了在钨和铜表面上的低能量等离子体聚焦装置中产生的质子和氩离子的破坏性效果。对初始和辐照样品进行光学显微镜,SEM,EDX,XRD和ERD分析。结果表明,氩气照射下的总热冲击比氢气的辐射更大。氩气后,在铜表面上观察到亚微米泡泡,在铜表面上观察到接合气泡和破裂图案。在氩气照射的钨样品上观察到微裂纹,表示熔融表面的快速退火。在质子照射的表面上观察到许多密集的水泡和离子溅射的证据。 ERD分析的结果表明,第二层中氢浓度的最高浓度为24%,达金钨表面的深度为20-55nm。在铜样品中,在第二层中发现氢的最高密度为23%,深度为28-68nm。而且,质子的最高渗透深度分别为钨和铜样品分别为118nm和160nm。

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