G'/> <![CDATA[Surface properties of SiO <ce:inf loc='post'>2</ce:inf> with and without H <ce:inf loc='post'>2</ce:inf>O <ce:inf loc='post'>2</ce:inf> treatment as gate dielectrics for pentacene thin-film transistor applications]]>
首页> 外文期刊>Chemical Physics Letters >2 with and without H 2O 2 treatment as gate dielectrics for pentacene thin-film transistor applications]]>
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2 with and without H 2O 2 treatment as gate dielectrics for pentacene thin-film transistor applications]]>

机译:<![cdata [cdata [sio 2 ,没有h 2 O 2 处理作为五烯薄膜晶体管应用的栅极电介质]]]>

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Graphical abstractO 1s core-level spectra for (a) as-cleaned and (b) H2O2-treated SiO2samples and (c) the difference between the O 1s XPS spectra for as-cleaned and H2O2-treated SiO2samples.Note that the existence of a hydrogenated layer between pentacene and SiO2leads to a change in the pentacene-SiO2interaction, increasing the value of the carrier mobility in the pentacene/SiO2–based organic thin-film transistor.Display OmittedHighlights?H2O2treatment led to the reduced number of trap states at the SiO2surface.?The pentacene transistor (PTFT) shows depletion-mode behavior.?A hydrogenated layer gives significant contributions
机译:<![cdata [ 图形摘要 O 1S核心级光谱(A)为(B)H 2 O 2 -Treated SIO 2 样品和(c)o 1s XPS光谱的差异和H 2 O 2 < / ce:inf> -treated sio 2 样本。 注意,五鲸和SIO之间的氢化层的存在 2 导致五苯-sio 相互作用,增加载体/ SIO中的载流子流动性的值 2 基于有机物薄膜晶体管。 显示省略 突出显示 h 2 o 2 治疗导致SIO 2 表面的陷阱状态减少。 五章晶体管(PTFT)显示耗尽模式行为。< / ce:para> 氢化层提供了重大贡献

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