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首页> 外文期刊>CERAMICS INTERNATIONAL >Influence of Bi4Ti3O12 doping on structural and piezoelectric properties of (K0.4425Na0.52Li0.0375)(Nb0.87Ta0.06Sb0.07)O-3 lead-free ceramics
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Influence of Bi4Ti3O12 doping on structural and piezoelectric properties of (K0.4425Na0.52Li0.0375)(Nb0.87Ta0.06Sb0.07)O-3 lead-free ceramics

机译:Bi4Ti3O12掺杂对(K0.4425NA0.52LI0.0375)结构和压电性能的影响(NB0.87TA0.06SB0.07)O-3无铅陶瓷

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摘要

Recently, (K, Na, Li)(Nb, Ta, Sb)O-3 ceramics have attracted much attention of researchers, and have become one of the most popular systems of KNN-based ceramics. In this paper, Bi4Ti3O12 was added in the (K0.4425Na0.52Li0.0375)(Nb0.87Ta0.06Sb0.07)O-3 ceramics (KNLNTS-x mol% BIT) to improve their piezoelectric properties. The phase formation and microstructure of KNLNTS-x mol% BIT ceramics were examined by X-ray diffraction (XRD) and scanning electron microscopy (SEM). With the addition of BIT, the permittivity maxima of samples shifted toward higher temperature firstly and then shifted to lower temperature. All samples showed well ferroelectric behavior and the density of (1-x)KNLNTS-x mol% BIT ceramics were increased and reached a relative density of 99.4%. High piezoelectric properties of d(33) = 255 pC/N, k(p) = 0.451, Q(m) = 186 were obtained for the samples containing 0.50 mol% BIT.
机译:最近,(K,Na,Li)(Nb,Ta,Sb)O-3陶瓷引起了研究人员的许多关注,并成为了最受欢迎的基于Knn的陶瓷系统之一。 在本文中,在(K0.4425NA0.52LI0.0375)中加入BI4TI3O12)(NB0.87TA0.06SB0.07)O-3陶瓷(KNLNTS-X MOL%位),以改善它们的压电性能。 通过X射线衍射(XRD)和扫描电子显微镜(SEM)检查KNLNTS-X mol%位陶瓷的相形成和微观结构。 随着比特的添加,样品的介电常数最大值首先向上移动,然后移至更低的温度。 所有样品显示出良好的铁电行为,并且(1-x)knlnts-x-x摩尔%位陶瓷的密度增加并达到相对密度为99.4%。 为含有0.50mol%位的样品获得D(33)= 255pc / n,k(p)= 0.451,q(m)= 186的高压电性能。

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