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Accurate determination of temperature dependent full matrix parameters of piezoelectric materials using only one sample

机译:仅使用一个样品准确确定压电材料的温度依赖性全矩阵参数

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It is of great importance to accurately determine the full matrix parameters of the piezoelectric materials using as few samples as possible. Here we performed a simple and widely applicable method to accurately determine the full matrix parameters of [001](c)-poled K(Ta,Nb)O-3 single crystal. Only one sample was used throughout the experiment procedure, which eliminated inconsistency from mull-sample testing. We also improved the accuracy of results by inversing the impedance spectra of two inequivalent crystallographic directions, [001](c) and [010](c). Based on this technique, variation of full matrix parameters with temperature were obtained using one sample. This work is of great significance for the characterization of novel piezoelectric materials and the evaluation of the performance of piezoelectric devices at various temperature.
机译:尽可能少量的样品准确地确定压电材料的全矩阵参数非常重要。 在这里,我们执行了一种简单宽容广泛的应用方法,可以精确地确定[001](c)-poled k(ta,nb)O-3单晶的全矩阵参数。 在整个实验程序中仅使用一个样品,从而消除了从Mull样本测试的不一致。 我们还通过反转两种不平等的结晶方向的阻抗光谱来提高结果的准确性,[001](c)和[010](c)。 基于该技术,使用一个样品获得温度的全基质参数的变化。 这项工作对于新型压电材料的表征具有重要意义以及在各种温度下的压电装置性能的评估。

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