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A folding technique for reducing circuit complexity of flash ADC decoders

机译:一种降低闪存ADC解码器电路复杂度的折叠技术

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摘要

The performance of a decoder is one of the factors that dominate the performance of a flash ADC. In this paper a folding technique is proposed to reduce the decoder circuit complexity. After folding, a k-bit decoder is replaced with two sub-decoders. The decoding of the upper k/2 bits and the lower k/2 bits can be accomplished respectively. Consequently, the number of inputs to the decoder is reduced to the square root of the original. Analytic results show that for different decoder structures, more than 17% of hardware and 13% of time delay can be saved. Moreover, the tolerance of bubble induced errors is enhanced. A 6-bit flash ADC has been implemented in 0.18-μm CMOS that occupies 0.37 mm × 0.35 mm active area. Simulations show that the figure-of-merit number is as low as 1.03 pJ/convsetp at 1G Sample/s and the maximum bubble induced error is limited to the number of bubbles.
机译:解码器的性能是决定闪存ADC性能的因素之一。本文提出了一种折叠技术来降低解码器电路的复杂度。折叠后,将k位解码器替换为两个子解码器。可以分别完成对高k / 2位和低k / 2位的解码。因此,解码器的输入数量减少到原始图像的平方根。分析结果表明,对于不同的解码器结构,可以节省超过17%的硬件和13%的时间延迟。此外,提高了气泡引起的误差的容忍度。在0.18μmCMOS中实现了6位闪存ADC,其有效面积为0.37 mm×0.35 mm。仿真显示,在1G Sample / s时,品质因数低至1.03 pJ / convsetp,并且最大气泡引起的误差限于气泡数。

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