The TS6700 LCD Driver Test System has been developed to satisfy the strong market requirement for higher performance/cost and to cope with the market trend of LCD drivers that are integrating more functions and becoming diversified. The per-pin architecture adopted in the I/O pins and in the measurement function of LCD pins can drastically reduce test time. In addition, the 2-DUT measurement capability per test head can further improve performance/cost. To cope with another market trend of higher pin count, the system has optimized LCD pin functions, and can install up to 736 LCD pins per test head with powerful per-pin measurement capability.
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机译：TS6700液晶驱动器测试系统已经开发，以满足更高的性能/成本的强大市场要求，并应对液晶驱动程序的市场趋势，这些驾驶员正在整合更多功能并成为多元化。 I / O引脚中采用的每个引脚架构以及LCD引脚的测量功能可能会急剧降低测试时间。 此外，每个测试头的2-DUT测量能力可以进一步提高性能/成本。 为了应对另一个较高PIN计数的市场趋势，系统具有优化的LCD引脚功能，可以每次测试头安装高达736个LCD引脚，具有强大的每引脚测量功能。
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