Preperation method of cross-section near surface analysis of copper based materials

摘要

Surface analysis technology for materials research is getting rather important in these days.Information not only from just the surface but also from near surface region, depth information, aremore and more required. As methods for depth analysis, ion sputtering from the surface and cross-sectional observationof polished specimen mold in resin are commonly being used. Ion sputtering method has difficulties toget enough resolution for rough surface. Polishing method for cross-sectional observation requires aspecial skill to make sound cross-section without deforming edge or without varying abrasive grit intospecimen.In this paper, microtome method for preparing a cross-sectional surface by slicing specimenwith a sharpen knife, are introduced. Method of making specimen and its application to copper andcopper alloy are introduced.