Strain Fields in Crystalline Materials: Methods of Analysis Based on X-rayDiffraction-Line Broadening (Rekvelden in Kristallijne Materialen: Analysemethoden Gebaseerd op Roentgendiffractie-Lijnverbreding)

摘要

The mechanical properties of crystalline materials are often largely determinedby the presence of crystal imperfections. All crystal imperfections, including the finite sizes of the grains or crystallites of the material, give rise to broadening of (X-ray) diffraction lines. In this thesis, the attention is concentrated on imperfections that are accompanied by microstrains, i.e. local distortions of the crystalline lattice. Examples of such crystal imperfections are dislocations, precipitates and inclusions. It is easily understood quantitatively that microstrains induce diffraction-line broadening. The aim of this thesis is to develop methods for the analysis of microstrains from (X-ray) diffraction-line broadening. Contents: Determination of Instrumental Line Broadening; Separation of Size and Strain Broadening; Specific Models for Strain Broadening; General Model for Strain Broadening.