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Thermal Stability of Oxide Film Formed on SiC Nanri,

机译:在SiC Nanri的氧化膜的热稳定性,

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Cristobalite formed by oxidation of SiC at 1400 deg C for 3h in air showed the mass loss and degradation of the crystallinity by repeatedly heat-treatment in argon atmosphere at 1400 deg C. The tendency in the mass loss was different by its crystallinity. Samples with good crystallinity showed decreasing tendency like a quadratic curve. Though the amount of mass loss was small at the early stage of heat-treatment, it was large at the later stage. On the other hand, mass loss of the samples with poor crystallinity showed decreasing tendency in rectilinear. And the decreasing rate remained almost constant from early stage to later stage of heat-treatment. The main factor of this mass loss is attributed to be the volatile SiO formed by solid state reaction between SiC and SiO_2.
机译:通过在1400℃的1400℃下氧化3h的Cristobalite在空气中通过在氩气氛中在1400℃的氩气氛中反复热处理来进行质量损失和降解结晶度。质量损失的趋势通过其结晶度不同。 具有良好结晶度的样品显示出像二次曲线一样的趋势。 虽然热处理早期的质量损失量小,但在后期阶段大。 另一方面,具有差的结晶度差的样品的质量损失显示出直线倾向降低。 从早期阶段到晚些时候的热处理阶段,降低率几乎保持不变。 该质量损失的主要因素归因于SiC和SiO_2之间的固态反应形成的挥发性SiO。

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