首页> 外文期刊>Current applied physics: the official journal of the Korean Physical Society >Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork
【24h】

Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork

机译:基于石英音叉的组合扫描隧道显微镜/原子力显微镜的超锐利铂/铱针尖的反向电化学刻蚀方法

获取原文
获取原文并翻译 | 示例
           

摘要

Sharp Pt/Ir tips have been reproducibly etched by an electrochemical process using an inverse geometry of an electrochemical cell and a dedicated electronic device which allows us to control the applied voltages waveform and the intensity of the etching current. Conductive tips with a radius smaller than 10 nm were routinely produced as shown by field emission measurements through Fowlere-Nordheim plots. These etched tips were then fixed on a quartz tuning fork force sensor working in a qPlus configuration to check their performances for both scanning tunneling microscopy (STM) and atomic force microscopy (AFM) imaging. Their sharpness and conductivity are evidenced by the resolution achieved in STM and AFM images obtained of epitaxial graphene on 6H-SiC(0001) surface. The structure of an epitaxial graphene layer thermally grown on the 6H-SiC(0001) (6 root 3 x 6 root 3) R30 degrees reconstructed surface, was successfully imaged at room temperature with STM, dynamic STM and by frequency modulated AFM. (C) 2015 Elsevier B.V. All rights reserved.
机译:尖锐的Pt / Ir尖端已通过电化学过程可逆地蚀刻,使用电化学电池的逆几何形状和专用电子设备进行蚀刻,这使我们能够控制施加的电压波形和蚀刻电流的强度。如通过Fowlere-Nordheim图进行的场发射测量所示,通常会产生半径小于10 nm的导电尖端。然后将这些蚀刻的尖端固定在以qPlus构造工作的石英音叉力传感器上,以检查其在扫描隧道显微镜(STM)和原子力显微镜(AFM)成像中的性能。通过在6H-SiC(0001)表面上外延石墨烯获得的STM和AFM图像中获得的分辨率证明了它们的清晰度和导电性。在室温,STM,动态STM和调频AFM下成功地在6H-SiC(0001)(6根3 x 6根3)R30度重建表面上热生长的外延石墨烯层的结构进行了成像。 (C)2015 Elsevier B.V.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号